Sec S3c2443x Test B D Driver Apr 2026

| Parameter | Meaning | |-----------|---------| | mode | 0 = buffer‑overflow test, 1 = timing jitter, 2 = fault‑injection | | iterations | Number of stress cycles (max 10 000) | | seed | Pseudo‑random seed for pattern generation |

/* 1. Acquire memory region */ res = platform_get_resource(pdev, IORESOURCE_MEM, 0); testbd->base = devm_ioremap_resource(&pdev->dev, res); if (IS_ERR(testbd->base)) return PTR_ERR(testbd->base); Sec S3c2443x Test B D Driver

/* 4. Register char device */ ret = alloc_chrdev_region(&dev_num, 0, 1, "sec_testbd"); if (ret) return ret; cdev_init(&testbd->cdev, &sec_testbd_fops); testbd->cdev.owner = THIS_MODULE; ret = cdev_add(&testbd->cdev, dev_num, 1); if (ret) goto err_unregister; | Parameter | Meaning | |-----------|---------| | mode